How to measure patent thickets – a novel approach

Graevenitz, Georg von; Wagner, Stefan; Harhoff, Dietmar (15. June 2009): How to measure patent thickets – a novel approach. Discussion Papers in Business Administration 2009-9

Abstract

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

• Item Type: Paper (Discussion Paper)
• Status: Submitted Version
• Keywords: patenting, patent thickets, patent portfolio races, complexity
• Faculties: Munich School of Management; Munich School of Management > Discussion Papers; Munich School of Management > Discussion Papers > Innovation Research
• Subjects: 300 Social sciences > 300 Social sciences, sociology and anthropology; 300 Social sciences > 330 Economics
• JEL Classification: L13, L20, O34
• Language: English