How to measure patent thickets – a novel approach

Graevenitz, Georg von; Wagner, Stefan und Harhoff, Dietmar (15. Juni 2009): How to measure patent thickets – a novel approach. Münchener Wirtschaftswissenschaftliche Beiträge (BWL) 2009-9

Abstract

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

• Dokumententyp: Paper
• Publikationsform: Submitted Version
• Keywords: patenting, patent thickets, patent portfolio races, complexity
• Fakultät: Betriebswirtschaft ; Betriebswirtschaft > Diskussionsbeiträge ; Betriebswirtschaft > Diskussionsbeiträge > Innovation Research
• Themengebiete: 300 Sozialwissenschaften > 300 Sozialwissenschaft, Soziologie ; 300 Sozialwissenschaften > 330 Wirtschaft
• JEL Classification: L13, L20, O34
• Sprache: Englisch