Sanakoyeu, Artsiom; Ma, Pingchuan; Tschernezki, Vadim und Ommer, Björn
ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Improving Deep Metric Learning by Divide and Conquer.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 44, No. 11: pp. 8306-8320
Additional link: https://ieeexplore.ieee.org/document/9540303
| Item Type: | Journal article |
|---|---|
| Faculties: | History and Art History > Department of Art History > Art History |
| Subjects: | 000 Computer science, information and general works > 000 Computer science, knowledge, and systems 700 Arts and recreation > 700 Arts |
| ISSN: | 0162-8828 |
| Language: | English |
| Item ID: | 109942 |
| Date Deposited: | 03. Apr 2024 13:48 |
| Last Modified: | 03. Apr 2024 13:48 |
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