Eder, Georg; Schlögl, Stefan; Macknapp, Klaus; Heckl, Wolfgang M. und Lackinger, Markus
(1. March 2011):
A combined ion-sputtering and electron-beam annealing device for the in vacuo postpreparation of scanning probes.
In: Review of Scientific Instruments, Vol. 82, 033701
[PDF, 857kB]
DOI: 10.1063/1.3556443
External fulltext: http://scitation.aip.org/content/aip/journal/rsi/82/3/10.1063/1.3556443
| Item Type: | Journal article |
|---|---|
| Form of publication: | Publisher's Version |
| Faculties: | Geosciences > Department of Earth and Environmental Sciences > Crystallography and Materials Science |
| Subjects: | 500 Science > 550 Earth sciences and geology 500 Science > 570 Life sciences; biology |
| URN: | urn:nbn:de:bvb:19-epub-17387-9 |
| ISSN: | 1089-7623 |
| Alliance/National Licence: | This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively. |
| Language: | English |
| Item ID: | 17387 |
| Date Deposited: | 29. Oct 2013 14:31 |
| Last Modified: | 04. Nov 2020 12:59 |
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