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Sitepu, H.; Schmahl, Wolfgang W.; Dreele, R. B. von; Chu, Y. Y.; Zhao, L. C. (2002): Quantitative texture analysis of polycrystalline shape-memory alloy NiTi neutron diffraction data by rietveld refinement using the generalized spherical-harmonic description. In: Materials Science Forum, Vol. 394-395: pp. 233-236
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The multiple-data-set capabilities of the Rietveld refinement program GSAS was used to extract a quantitative texture description from a simultaneous refinement of 52 time-of-flight neutron diffraction patterns taken from a NiTi polycrystalline sample held in a variety of orientations in the diffractometer. The patterns were analyzed using a generalized spherical-harmonic model for the preferred orientation. With this method the accuracy of the available crystal structure parameters of the monoclinic B 19’ phase of near stochiometric NiTi (50.14 atomic \% Ni) system at room temperature has been improved dramatically.