Abstract
Anisotropic diffuse scattering of the 1D conductor K-hollandite has been measured at a synchrotron source and compared with measurements with a rotating anode. The intensity gain of more than one order of magnitude and the ability to adjust the wavelength provide the counting statistics in a few hours that are necessary for a quantitative analysis of diffuse phenomena. The main advantage of a synchroton source is the high resolution throughout reciprocal space (low and high Q). Thus, commensurate/incommensurate positions of diffuse layers may be distinguished, weak diffuse maxima become detectable and small peak shifts of diffuse modulations clearly visible.
Dokumententyp: | Zeitschriftenartikel |
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Fakultät: | Geowissenschaften > Department für Geo- und Umweltwissenschaften > Kristallographie und Materialwissenschaft |
Themengebiete: | 500 Naturwissenschaften und Mathematik > 550 Geowissenschaften, Geologie |
URN: | urn:nbn:de:bvb:19-epub-18591-2 |
Sprache: | Englisch |
Dokumenten ID: | 18591 |
Datum der Veröffentlichung auf Open Access LMU: | 10. Mrz. 2014, 14:11 |
Letzte Änderungen: | 04. Nov. 2020, 13:00 |