
Abstract
It is demonstrated that surface-sensitive electron diffraction measurements of steps on singular, but rough Si(100) surfaces are subject to a multiple-scattering effect that can be misinterpreted as double-atomic-height steps. It is shown that only single-height steps are present. This phenomenon can occur in any surface in which adjacent terraces have different terrace structure factors. Determination of terrace sizes can be influenced; however, they can be accurately made if the diffraction geometry is chosen appropriately. Possible terrace shape effects may also be inherent in the diffraction data.
Item Type: | Journal article |
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Faculties: | Geosciences > Department of Earth and Environmental Sciences > Crystallography and Materials Science |
Subjects: | 500 Science > 550 Earth sciences and geology |
URN: | urn:nbn:de:bvb:19-epub-5791-3 |
Language: | English |
Item ID: | 5791 |
Date Deposited: | 22. Aug 2008, 11:21 |
Last Modified: | 04. Nov 2020, 12:48 |