A novel procedure for fast surface structural analysis based on LEED intensity data

Kleinle, Gerald; Moritz, Wolfgang; Adams, David L. und Ertl, Gerhard (1989): A novel procedure for fast surface structural analysis based on LEED intensity data. In: Surface Science, Bd. 219, Nr. 3: L637-L645

Abstract

By evaluating LEED intensities from different diffraction beams taken only at discrete energy intervals (which may be as large as 15–20 eV) the same degree of reliability in surface structure determination can be reached as with the conventional techniques based on analysis of continuous I/V-spectra. The minimum of the corresponding R-factor can be found by a least-squares fit method, as will be exemplified with a system in which 8 structural parameters were subject to simultaneous refinement.

• Dokumententyp: Zeitschriftenartikel
• Fakultät: Geowissenschaften > Department für Geo- und Umweltwissenschaften > Kristallographie und Materialwissenschaft
• Themengebiete: 500 Naturwissenschaften und Mathematik > 550 Geowissenschaften, Geologie
• Sprache: Englisch