Schamper, Christian; Meyerheim, Holger L.; Moritz, Wolfgang and Schulz, H.
(1992):
Analytical calculation of the resolution correction function for X-ray surface structure analysis.
In: Zabel, Hartmut and Robinson, Ian K. (eds.) :
Surface X-Ray and Neutron Scattering - Springer Proceedings in Physics. Springer proceedings in physics, Berlin [u.a.]: Springer. pp. 247-249
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| Item Type: | Conference or Workshop Item (Speech) |
|---|---|
| Faculties: | Geosciences > Department of Earth and Environmental Sciences > Crystallography and Materials Science |
| Subjects: | 500 Science > 550 Earth sciences and geology |
| URN: | urn:nbn:de:bvb:19-epub-5883-8 |
| Place of Publication: | Berlin [u.a.] |
| Signature: | BSB:92.44447 |
| Language: | English |
| Item ID: | 5883 |
| Date Deposited: | 27. Aug 2008 15:52 |
| Last Modified: | 04. Nov 2020 12:49 |
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