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Zeitschriftenartikel
Waegeman, Willem 
ORCID: https://orcid.org/0000-0002-5950-3003; Dembczyński, Krzysztof; Jachnik, Arkadiusz; Cheng, Weiwei und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(November 2014):
On the Bayes-Optimality of F-Measure Maximizers.
In: Journal of Machine Learning Research, Bd. 15, 103: S. 3513-3568
ORCID: https://orcid.org/0000-0002-5950-3003; Dembczyński, Krzysztof; Jachnik, Arkadiusz; Cheng, Weiwei und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(November 2014):
On the Bayes-Optimality of F-Measure Maximizers.
In: Journal of Machine Learning Research, Bd. 15, 103: S. 3513-3568
Konferenzbeitrag
Dembczyński, Krzysztof; Jachnik, Arkadiusz; Kotlowski, Wojciech; Waegeman, Willem und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2013):
Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization.
ICML'13: 30th International Conference on International Conference on Machine Learning, Atlanta GA USA, June 16 - 21, 2013.
Dasgupta, Sanjoy und McAllester, David (Hrsg.):
In: Proceedings of the 30th International Conference on Machine Learning,
Bd. 28, Nr. 3
S. 1030-1038
ORCID: https://orcid.org/0000-0002-9944-4108
(2013):
Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization.
ICML'13: 30th International Conference on International Conference on Machine Learning, Atlanta GA USA, June 16 - 21, 2013.
Dasgupta, Sanjoy und McAllester, David (Hrsg.):
In: Proceedings of the 30th International Conference on Machine Learning,
Bd. 28, Nr. 3
S. 1030-1038