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Eine Ebene höherGruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Anzahl der Publikationen: 4
2018
Liewald, C.; Strohmair, S.; Hecht, H.; Glowacki, E. D. und Nickel, B.
(2018):
Scanning photocurrent microscopy of electrons and holes in the pigment semiconductor epindolidione.
In: Organic Electronics, Bd. 60: S. 51-56
Darwish, M.; Boysan, H.; Liewald, C.; Nickel, B. und Gagliardi, A.
(2018):
A resistor network simulation model for laser-scanning photo-current microscopy to quantify low conductance regions in organic thin films.
In: Organic Electronics, Bd. 62: S. 474-480
2016
Liewald, C.; Reiser, D.; Westermeier, C. und Nickel, B.
(2016):
Photocurrent microscopy of contact resistance and charge carrier traps in organic field-effect transistors.
In: Applied Physics Letters, Bd. 109, Nr. 5, 53301
Liewald, C.; Scamarcio, G.; Columbo, L.; Brambilla, M. und Keilmann, F.
(2016):
Laser Self-Detection Operation of a Mid-IR Near-Field Microscope.
2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Copenhagen, Denmark, 25-30 Sept. 2016.
In: 2016 41st International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) : 25-30 Sept. 2016,
Piscataway, NJ: IEEE Computer Society.