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Eine Ebene höherGruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Anzahl der Publikationen: 4
2018
Liewald, Clemens; Mastel, Stefan; Hesler, Jeffrey; Huber, Andreas J.; Hillenbrand, Rainer und Keilmann, Fritz
(2018):
All-electronic terahertz nanoscopy.
In: Optica, Bd. 5, Nr. 2: S. 159-163
[PDF, 1MB]
Giordano, Maria C.; Mastel, Stefan; Liewald, Clemens; Columbo, Lorenzo L.; Brambilla, Massimo; Viti, Leonardo; Politano, Antonio; Zhang, Kai; Li, Lianhe; Davies, A. Giles; Linfield, Edmund H.; Hillenbrand, Rainer; Keilmann, Fritz; Scamarcio, Gaetano und Vitiello, Miriam S.
(2018):
Phase-resolved terahertz self-detection near-field microscopy.
In: Optics Express, Bd. 26, Nr. 14: S. 18423-18435
[PDF, 3MB]
2017
Noever, Simon J.; Eder, Michael; del Giudice, Fabio; Martin, Jan; Werkmeister, Franz X.; Hallwig, Stefan; Fischer, Stefan; Seeck, Oliver; Weber, Nils-Eike; Liewald, Clemens; Keilmann, Fritz; Turchanin, Andrey und Nickel, Bert
(2017):
Transferable Organic Semiconductor Nanosheets for Application in Electronic Devices.
In: Advanced Materials, Bd. 29, Nr. 26, 1606283
2014
Westermeier, Christian; Cernescu, Adrian; Amarie, Sergiu; Liewald, Clemens; Keilmann, Fritz und Nickel, Bert
(2014):
Sub-micron phase coexistence in small-molecule organic thin films revealed by infrared nano-imaging.
In: Nature Communications, Bd. 5, 4101
[PDF, 1MB]