Logo Logo
Eine Ebene nach oben
Exportieren als [RSS feed] RSS 1.0 [RSS2 feed] RSS 2.0
Gruppiert nach: Dokumententyp | Veröffentlichungsdatum
Anzahl der Publikationen: 5

Zeitschriftenartikel

Kopp, Benedikt; Meyer, Sebastian; Gianoli, Chiara; Magallanes, Lorena; Voss, Bernd; Brons, Stephan und Parodi, Katia ORCID logoORCID: https://orcid.org/0000-0001-7779-6690 (2020): Experimental comparison of clinically used ion beams for imaging applications using a range telescope. In: Physics in medicine and biology, Bd. 65, Nr. 15, 155004 [PDF, 1MB]

Gianoli, Chiara; Meyer, Sebastian; Magallanes, Lorena; Paganelli, Chiara; Baroni, Guido und Parodi, Katia (2019): Analytical simulator of proton radiography and tomography for different detector configurations. In: Physica Medica-European Journal of Medical Physics, Bd. 59: S. 92-99

Meyer, Sebastian; Gianoli, Chiara; Magallanes, Lorena; Kopp, Benedikt; Tessonnier, Thomas; Landry, Guillaume; Dedes, George; Voss, Bernd und Parodi, Katia (2017): Comparative Monte Carlo study on the performance of integration-and list-mode detector configurations for carbon ion computed tomography. In: Physics in Medicine and Biology, Bd. 62, Nr. 3: S. 1096-1112

Gianoli, Chiara; Dedes, George; Meyer, Sebastian; Magallanes, Lorena; Landry, Guillaume; Nijhuis, Reinoud; Ganswindt, Ute; Thieke, Christian; Belka, Claus und Parodi, Katia ORCID logoORCID: https://orcid.org/0000-0001-7779-6690 (2016): Merging proton radiographies with treatment planning CT for adaptive radiation therapy. PO-0909. In: Radiotherapy and Oncology, Bd. 119, Nr. Supplement 1: S438 [PDF, 147kB]

Konferenzbeitrag

Meyer, Sebastian; Magallanes, Lorena; Kopp, Benedikt; Tessonnier, Thomas; Landry, Guillaume; Dedes, George; Voss, Bernd; Jaekel, Oliver; Belka, Claus; Gianoli, Chiara und Parodi, Katia ORCID logoORCID: https://orcid.org/0000-0001-7779-6690 (2016): Tomographic Imaging with Carbon Ion Beams. 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, France, 29. Oktober - 6. November 2016. New York: IEEE.

Diese Liste wurde am Sun Apr 21 00:19:01 2024 CEST erstellt.