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Anzahl der Publikationen: 3
Zeitschriftenartikel
Oliva, Diego; Ufer, Nikolai 
ORCID: https://orcid.org/0000-0002-5166-2843; Simon, Max; Lang, Sabine und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(24. November 2021):
Large-scale interactive retrieval in art collections using multi-style feature aggregation.
In: PLOS ONE 16(11), e0259718 [PDF, 6MB]
ORCID: https://orcid.org/0000-0002-5166-2843; Simon, Max; Lang, Sabine und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(24. November 2021):
Large-scale interactive retrieval in art collections using multi-style feature aggregation.
In: PLOS ONE 16(11), e0259718 [PDF, 6MB]
Konferenzbeitrag
Ufer, Nikolai ORCID: https://orcid.org/0000-0002-5166-2843; Lang, Sabine ORCID: https://orcid.org/0000-0003-2543-0085 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Object Retrieval and Localization in Large Art Collections Using Deep Multi-style Feature Fusion and Iterative Voting.
16th European Conference on Computer Vision (ECCV) : VISART workshop, Glasgow, 23.-28. August 2020.
Bartoli, Adrien und Fusiello, Andrea (Hrsg.):
In: Computer Vision – ECCV 2020 Workshop Proceedings,
Bd. 2
Cham: Springer International Publishing. S. 159-176
ORCID: https://orcid.org/0000-0002-5166-2843; Lang, Sabine ORCID: https://orcid.org/0000-0003-2543-0085 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Object Retrieval and Localization in Large Art Collections Using Deep Multi-style Feature Fusion and Iterative Voting.
16th European Conference on Computer Vision (ECCV) : VISART workshop, Glasgow, 23.-28. August 2020.
Bartoli, Adrien und Fusiello, Andrea (Hrsg.):
In: Computer Vision – ECCV 2020 Workshop Proceedings,
Bd. 2
Cham: Springer International Publishing. S. 159-176
Ufer, Nikolai und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2017):
Deep Semantic Feature Matching.
2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Honolulu, HI, USA, 21-26 July 2017.
In: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 5929-5938
ORCID: https://orcid.org/0000-0003-0766-120X
(2017):
Deep Semantic Feature Matching.
2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Honolulu, HI, USA, 21-26 July 2017.
In: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 5929-5938