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Anzahl der Publikationen: 6
Zeitschriftenartikel
Sanakoyeu, Artsiom; Ma, Pingchuan; Tschernezki, Vadim und Ommer, Björn 
ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Improving Deep Metric Learning by Divide and Conquer.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Bd. 44, Nr. 11: S. 8306-8320
ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Improving Deep Metric Learning by Divide and Conquer.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Bd. 44, Nr. 11: S. 8306-8320
Sanakoyeu, Artsiom; Bautista, Miguel A. und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2018):
Deep unsupervised learning of visual similarities.
In: Pattern Recognition, Bd. 78: S. 331-343
ORCID: https://orcid.org/0000-0003-0766-120X
(2018):
Deep unsupervised learning of visual similarities.
In: Pattern Recognition, Bd. 78: S. 331-343
Konferenzbeitrag
Sanakoyeu, Artsiom; Tschernezki, Vadim; Büchler, Uta ORCID: https://orcid.org/0000-0002-0074-8559 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
Divide and Conquer the Embedding Space for Metric Learning.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 471-480
ORCID: https://orcid.org/0000-0002-0074-8559 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
Divide and Conquer the Embedding Space for Metric Learning.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 471-480
Kotovenko, Dmytro; Sanakoyeu, Artsiom; Ma, Pingchuan; Lang, Sabine und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
A Content Transformation Block for Image Style Transfer.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 10024-10033
ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
A Content Transformation Block for Image Style Transfer.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 10024-10033
Sanakoyeu, Artsiom; Kotovenko, Dmytro; Lang, Sabine ORCID: https://orcid.org/0000-0003-2543-0085 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2018):
A Style-Aware Content Loss for Real-Time HD Style Transfer.
15th European Conference on Computer Vision (ECCV), München, 8.-14. September 2018.
Ferrari, Vittorio; Hebert, Martial; Sminchisescu, Cristian und Weiss, Yair (Hrsg.):
In: Computer Vision – ECCV 2018 Proceedings,
Bd. 8
Cham: Springer International Publishing. S. 715-731
ORCID: https://orcid.org/0000-0003-2543-0085 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2018):
A Style-Aware Content Loss for Real-Time HD Style Transfer.
15th European Conference on Computer Vision (ECCV), München, 8.-14. September 2018.
Ferrari, Vittorio; Hebert, Martial; Sminchisescu, Cristian und Weiss, Yair (Hrsg.):
In: Computer Vision – ECCV 2018 Proceedings,
Bd. 8
Cham: Springer International Publishing. S. 715-731
Bautista, Miguel A.; Sanakoyeu, Artsiom und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2017):
Deep Unsupervised Similarity Learning Using Partially Ordered Sets.
2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Honolulu, HI, USA, 21-26 July 2017.
In: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 1923-1932
ORCID: https://orcid.org/0000-0003-0766-120X
(2017):
Deep Unsupervised Similarity Learning Using Partially Ordered Sets.
2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Honolulu, HI, USA, 21-26 July 2017.
In: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 1923-1932