Anzahl der Publikationen: 5
Zeitschriftenartikel
Schwinger, Daniel P.; Peschel, Martin T.; Rigotti, Thomas; Kabacinski, Piotr; Knoll, Thomas; Thyrhaug, Erling; Cerullo, Giulio; Hauer, Juergen; de Vivie-Riedle, Regina und Bach, Thorsten
(2022):
Photoinduced B-Cl Bond Fission in Aldehyde-BCl3 Complexes as a Mechanistic Scenario for C-H Bond Activation.
In: Journal of the American Chemical Society, Bd. 144, Nr. 41: S. 18927-18937
Genco, Armando; Cruciano, Cristina; Corti, Matteo; McGhee, Kirsty E.; Ardini, Benedetto; Sortino, Luca; Huettenhofer, Ludwig; Virgili, Tersilla; Lidzey, David G.; Maier, Stefan A.; Bassi, Andrea; Valentini, Gianluca; Cerullo, Giulio und Manzoni, Cristian
(2022):
k-Space Hyperspectral Imaging by a Birefringent Common-Path Interferometer.
In: ACS Photonics, Bd. 9, Nr. 11: S. 3563-3572
Kabacinski, Piotr; Romanelli, Marco; Ponkkonen, Eveliina; Jaiswal, Vishal Kumar; Carell, Thomas; Garavelli, Marco; Cerullo, Giulio und Conti, Irene
(2021):
Unified Description of Ultrafast Excited State Decay Processes in Epigenetic Deoxycytidine Derivatives.
In: Journal of Physical Chemistry Letters, Bd. 12, Nr. 45: S. 11070-11077
Peschel, Martin T.; Kabacinski, Piotr; Schwinger, Daniel P.; Thyrhaug, Erling; Cerullo, Giulio; Bach, Thorsten; Hauer, Jürgen und Vivie-Riedle, Regina de
(2021):
Activation of 2-Cyclohexenone by BF3 Coordination: Mechanistic Insights from Theory and Experiment.
In: Angewandte Chemie-International Edition, Bd. 60, Nr. 18: S. 10155-10163
Konferenzbeitrag
Kabacinski, Piotr; Romanelli, Marco; Ponkkonen, Eveliina; Conti, Irene; Carell, Thomas ORCID: https://orcid.org/0000-0001-7898-2831; Garavelli, Marco und Cerullo, Giulio
(2021):
Excited State Decay Pathways Of Epigenetic DNA Nucleosides Tracked With Sub-20-fs UV Pulses.
Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), Munich, Germany, 21-25 June 2021.
In: 2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC),
New York: IEEE. S. 1
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