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Anzahl der Publikationen: 3
Zeitschriftenartikel
Sanakoyeu, Artsiom; Ma, Pingchuan; Tschernezki, Vadim und Ommer, Björn 
ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Improving Deep Metric Learning by Divide and Conquer.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Bd. 44, Nr. 11: S. 8306-8320
ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Improving Deep Metric Learning by Divide and Conquer.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Bd. 44, Nr. 11: S. 8306-8320
Ravanbakhsh, Mahdyar; Tschernezki, Vadim; Last, Felix; Klein, Tassilo; Batmanghelich, Kayhan; Tresp, Volker und Nabi, Moin
(2020):
HUMAN-MACHINE COLLABORATION FOR MEDICAL IMAGE SEGMENTATION.
In: 2020 IEEE International Conference on Acoustics, Speech, and Signal Processing: S. 1040-1044
Konferenzbeitrag
Sanakoyeu, Artsiom; Tschernezki, Vadim; Büchler, Uta ORCID: https://orcid.org/0000-0002-0074-8559 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
Divide and Conquer the Embedding Space for Metric Learning.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 471-480
ORCID: https://orcid.org/0000-0002-0074-8559 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
Divide and Conquer the Embedding Space for Metric Learning.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 471-480