|
Eine Ebene nach oben |
Gruppiert nach:
Dokumententyp
| Veröffentlichungsdatum
Anzahl der Publikationen: 15
Zeitschriftenartikel
Mortier, Thomas 
ORCID: https://orcid.org/0000-0001-9650-9263; Wydmuch, Marek; Dembczyński, Krzysztof; Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108 und Waegeman, Willem
(Mai 2021):
Efficient set-valued prediction in multi-class classification.
In: Data Mining and Knowledge Discovery, Bd. 35, Nr. 4: S. 1435-1469
ORCID: https://orcid.org/0000-0001-9650-9263; Wydmuch, Marek; Dembczyński, Krzysztof; Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108 und Waegeman, Willem
(Mai 2021):
Efficient set-valued prediction in multi-class classification.
In: Data Mining and Knowledge Discovery, Bd. 35, Nr. 4: S. 1435-1469
Waegeman, Willem ORCID: https://orcid.org/0000-0002-5950-3003; Dembczyński, Krzysztof und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2019):
Multi-target prediction: a unifying view on problems and methods.
In: Data Mining and Knowledge Discovery, Bd. 33, Nr. 2: S. 293-324
ORCID: https://orcid.org/0000-0002-5950-3003; Dembczyński, Krzysztof und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2019):
Multi-target prediction: a unifying view on problems and methods.
In: Data Mining and Knowledge Discovery, Bd. 33, Nr. 2: S. 293-324
Waegeman, Willem ORCID: https://orcid.org/0000-0002-5950-3003; Dembczyński, Krzysztof; Jachnik, Arkadiusz; Cheng, Weiwei und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(November 2014):
On the Bayes-Optimality of F-Measure Maximizers.
In: Journal of Machine Learning Research, Bd. 15, 103: S. 3513-3568
ORCID: https://orcid.org/0000-0002-5950-3003; Dembczyński, Krzysztof; Jachnik, Arkadiusz; Cheng, Weiwei und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(November 2014):
On the Bayes-Optimality of F-Measure Maximizers.
In: Journal of Machine Learning Research, Bd. 15, 103: S. 3513-3568
Senge, Robin; Bösner, Stefan; Dembczyński, Krzysztof; Haasenritter, Jörg; Hirsch, Oliver; Donner-Banzhoff, Norbert und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2014):
Reliable classification: Learning classifiers that distinguish aleatoric and epistemic uncertainty.
In: Information Sciences, Bd. 255: S. 16-29
ORCID: https://orcid.org/0000-0002-9944-4108
(2014):
Reliable classification: Learning classifiers that distinguish aleatoric and epistemic uncertainty.
In: Information Sciences, Bd. 255: S. 16-29
Tehrani, Ali Fallah; Cheng, Weiwei; Dembczyński, Krzysztof und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2012):
Learning monotone nonlinear models using the Choquet integral.
In: Machine Learning, Bd. 89, Nr. 1-2: S. 183-211
ORCID: https://orcid.org/0000-0002-9944-4108
(2012):
Learning monotone nonlinear models using the Choquet integral.
In: Machine Learning, Bd. 89, Nr. 1-2: S. 183-211
Dembczyński, Krzysztof; Waegeman, Willem; Cheng, Weiwei und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2012):
On label dependence and loss minimization in multi-label classification.
In: Machine Learning, Bd. 88, Nr. 1-2: S. 5-45
ORCID: https://orcid.org/0000-0002-9944-4108
(2012):
On label dependence and loss minimization in multi-label classification.
In: Machine Learning, Bd. 88, Nr. 1-2: S. 5-45
Buchbeitrag
Dembczyński, Krzysztof; Kotłowski, Wojciech; Waegeman, Willem; Busa-Fekete, Róbert und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2016):
Consistency of Probabilistic Classifier Trees.
In: Frasconi, Paolo; Landwehr, Niels; Manco, Giuseppe und Vreeken, Jilles (Hrsg.):
Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2016, Riva del Garda, Italy, September 19-23, 2016, Proceedings, Part II. Lecture Notes in Computer Science, Bd. 9852. Cham: Springer. S. 511-526
ORCID: https://orcid.org/0000-0002-9944-4108
(2016):
Consistency of Probabilistic Classifier Trees.
In: Frasconi, Paolo; Landwehr, Niels; Manco, Giuseppe und Vreeken, Jilles (Hrsg.):
Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2016, Riva del Garda, Italy, September 19-23, 2016, Proceedings, Part II. Lecture Notes in Computer Science, Bd. 9852. Cham: Springer. S. 511-526
Ewerth, Ralph; Balz, Alexander; Gehlhaar, Jan; Dembczyński, Krzysztof und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(November 2015):
Depth Estimation in Monocular Images: Quantitative versus Qualitative Approaches.
In: Hoffmann, Frank und Hüllermeier, Eyke (Hrsg.):
Proceedings. 25. Workshop Computational Intelligence, Dortmund, 26. - 27. November 2015. Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie, Bd. 54. Karlsruhe: KIT Scientific Publishing. S. 235-239
ORCID: https://orcid.org/0000-0002-9944-4108
(November 2015):
Depth Estimation in Monocular Images: Quantitative versus Qualitative Approaches.
In: Hoffmann, Frank und Hüllermeier, Eyke (Hrsg.):
Proceedings. 25. Workshop Computational Intelligence, Dortmund, 26. - 27. November 2015. Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie, Bd. 54. Karlsruhe: KIT Scientific Publishing. S. 235-239
Dembczyński, Krzysztof; Waegeman, Willem und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(August 2012):
An Analysis of Chaining in Multi-Label Classification.
In: De Raedt, Luc; Bessiere, Christian; Dubois, Didier; Doherty, Patrick; Frasconi, Paolo; Heintz, Fredrik und Lucas, Peter (Hrsg.):
ECAI 2012 : 20th European Conference on Artificial Intelligence, 27 - 31 August 2012, Montpellier, France. Frontiers in Artificial Intelligence and Applications, Bd. 242. Amsterdam: IOS Press. S. 294-299
[PDF, 258kB]
ORCID: https://orcid.org/0000-0002-9944-4108
(August 2012):
An Analysis of Chaining in Multi-Label Classification.
In: De Raedt, Luc; Bessiere, Christian; Dubois, Didier; Doherty, Patrick; Frasconi, Paolo; Heintz, Fredrik und Lucas, Peter (Hrsg.):
ECAI 2012 : 20th European Conference on Artificial Intelligence, 27 - 31 August 2012, Montpellier, France. Frontiers in Artificial Intelligence and Applications, Bd. 242. Amsterdam: IOS Press. S. 294-299
[PDF, 258kB]
Dembczyński, Krzysztof; Waegeman, Willem; Cheng, Weiwei und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2010):
Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.
In: Balcázar, José Luis; Bonchi, Francesco; Gionis, Aristides und Sebag, Michèle (Hrsg.):
Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2010, Barcelona, Spain, September 20-24, 2010, Proceedings, Part I. Lecture Notes in Computer Science, Bd. 6321. Berlin, Heidelberg: Springer. S. 280-295
ORCID: https://orcid.org/0000-0002-9944-4108
(2010):
Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.
In: Balcázar, José Luis; Bonchi, Francesco; Gionis, Aristides und Sebag, Michèle (Hrsg.):
Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2010, Barcelona, Spain, September 20-24, 2010, Proceedings, Part I. Lecture Notes in Computer Science, Bd. 6321. Berlin, Heidelberg: Springer. S. 280-295
Konferenzbeitrag
Mortier, Thomas ORCID: https://orcid.org/0000-0001-9650-9263; Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108; Dembczyński, Krzysztof und Waegeman, Willem ORCID: https://orcid.org/0000-0002-5950-3003
(August 2022):
Set-valued prediction in hierarchical classification with constrained representation complexity.
38th Conference on Uncertainty in Artificial Intelligence, Eindhoven, Netherlands, 1-5 August 2022.
Cussens, James und Zhang, Kun (Hrsg.):
In: Proceedings of the Thirty-Eighth Conference on Uncertainty in Artificial Intelligence,
Bd. 180
PMLR. S. 1392-1401
ORCID: https://orcid.org/0000-0001-9650-9263; Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108; Dembczyński, Krzysztof und Waegeman, Willem ORCID: https://orcid.org/0000-0002-5950-3003
(August 2022):
Set-valued prediction in hierarchical classification with constrained representation complexity.
38th Conference on Uncertainty in Artificial Intelligence, Eindhoven, Netherlands, 1-5 August 2022.
Cussens, James und Zhang, Kun (Hrsg.):
In: Proceedings of the Thirty-Eighth Conference on Uncertainty in Artificial Intelligence,
Bd. 180
PMLR. S. 1392-1401
Ewerth, Ralph; Springstein, Matthias; Müller, Eric; Balz, Alexander; Gehlhaar, Jan; Naziyok, Tolga; Dembczyński, Krzysztof und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2017):
Estimating relative depth in single images via rankboost.
2017 IEEE International Conference on Multimedia and Expo (ICME), Hong Kong, 10-14 July 2017.
In: 2017 IEEE International Conference on Multimedia and Expo (ICME) : Hong Kong, 10-14 July 2017,
Piscataway, NJ: IEEE. S. 919-924
ORCID: https://orcid.org/0000-0002-9944-4108
(2017):
Estimating relative depth in single images via rankboost.
2017 IEEE International Conference on Multimedia and Expo (ICME), Hong Kong, 10-14 July 2017.
In: 2017 IEEE International Conference on Multimedia and Expo (ICME) : Hong Kong, 10-14 July 2017,
Piscataway, NJ: IEEE. S. 919-924
Dembczyński, Krzysztof; Jachnik, Arkadiusz; Kotlowski, Wojciech; Waegeman, Willem und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2013):
Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization.
ICML'13: 30th International Conference on International Conference on Machine Learning, Atlanta GA USA, June 16 - 21, 2013.
Dasgupta, Sanjoy und McAllester, David (Hrsg.):
In: Proceedings of the 30th International Conference on Machine Learning,
Bd. 28, Nr. 3
S. 1030-1038
ORCID: https://orcid.org/0000-0002-9944-4108
(2013):
Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization.
ICML'13: 30th International Conference on International Conference on Machine Learning, Atlanta GA USA, June 16 - 21, 2013.
Dasgupta, Sanjoy und McAllester, David (Hrsg.):
In: Proceedings of the 30th International Conference on Machine Learning,
Bd. 28, Nr. 3
S. 1030-1038
Dembczyński, Krzysztof; Kotłowski, Wojciech und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(Juni 2012):
Consistent multilabel ranking through univariate loss minimization.
ICML'12: 29th International Coference on International Conference on Machine Learning, Edinburgh, Scotland, UK, 26 June 2012- 1 July 2012.
Langford, John und Pineau, Joelle (Hrsg.):
In: Proceedings of the Twenty-Ninth International Conference on Machine Learning,
S. 1347-1354
ORCID: https://orcid.org/0000-0002-9944-4108
(Juni 2012):
Consistent multilabel ranking through univariate loss minimization.
ICML'12: 29th International Coference on International Conference on Machine Learning, Edinburgh, Scotland, UK, 26 June 2012- 1 July 2012.
Langford, John und Pineau, Joelle (Hrsg.):
In: Proceedings of the Twenty-Ninth International Conference on Machine Learning,
S. 1347-1354
Cheng, Weiwei; Dembczyński, Krzysztof und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2010):
Graded multilabel classification: the ordinal case.
ICML '10: 27th International Conference on International Conference on Machine Learning, Haifa, Israel, June 21 - 24, 2010.
In: ICML'10: Proceedings of the 27th International Conference on International Conference on Machine Learning,
Madison, WI: Omnipress. S. 223-230
ORCID: https://orcid.org/0000-0002-9944-4108
(2010):
Graded multilabel classification: the ordinal case.
ICML '10: 27th International Conference on International Conference on Machine Learning, Haifa, Israel, June 21 - 24, 2010.
In: ICML'10: Proceedings of the 27th International Conference on International Conference on Machine Learning,
Madison, WI: Omnipress. S. 223-230